Anomalous scaling behavior in a solid-on-solid model for epitaxial growth

Chang Su Ryu, K. P. Heo, and In-mook Kim
Phys. Rev. E 54, 284 – Published 1 July 1996
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Abstract

We study the correlation function in a solid-on-solid model for epitaxial growth on one-dimensional substrates. In the transient regime, we find an anomalous situation that the roughness exponent (α≊1) obtained from the surface width is different from that (α≊0.75) of the correlation function, which is well described by the scaling hypotheses previously proposed by Schroeder et al. [M. Schroeder, M. Siegert, D. E. Wolf, J. D. Shore, and M. Plischke, Europhys. Lett. 24, 563 (1993)] and Das Sarma, Ghaisas, and Kim [S. Das Sarma, S. V. Ghaisas, and J. M. Kim, Phys. Rev. E 49, 122 (1994)]. Few have been reported for anomalous scaling behaviors of the correlation function in growth models with α≤1. We also measure the surface width for various ranges in a fixed size of system as in experiments. In case a surface width for a very small scale shows a power-law increase with time, the roughness exponent α measured in experiments should be converted to α determining the universality classes. © 1996 The American Physical Society.

  • Received 4 December 1995

DOI:https://doi.org/10.1103/PhysRevE.54.284

©1996 American Physical Society

Authors & Affiliations

Chang Su Ryu

  • Electronics and Telecommunications Research Institute, Yusong P. O. Box 106, Taejon, 305-600, Korea

K. P. Heo and In-mook Kim

  • Department of Physics, Korea University, Seoul 136-701, Korea

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Vol. 54, Iss. 1 — July 1996

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