Orbital characters determined from Fermi surface intensity patterns using angle-resolved photoemission spectroscopy

X.-P. Wang, P. Richard, Y.-B. Huang, H. Miao, L. Cevey, N. Xu, Y.-J. Sun, T. Qian, Y.-M. Xu, M. Shi, J.-P. Hu, X. Dai, and H. Ding
Phys. Rev. B 85, 214518 – Published 19 June 2012

Abstract

In order to determine the orbital characters on the various Fermi surface pockets of the Fe-based superconductors Ba0.6K0.4Fe2As2 and FeSe0.45Te0.55, we introduce a method to calculate photoemission matrix elements. We compare our simulations to experimental data obtained with various experimental configurations of beam orientation and light polarization. We show that the photoemission intensity patterns revealed from angle-resolved photoemission spectroscopy measurements of Fermi surface mappings and energy-momentum plots along high-symmetry lines exhibit asymmetries carrying precious information on the nature of the states probed, information that is destroyed after the data symmetrization process often performed in the analysis of angle-resolved photoemission spectroscopy data. Our simulations are consistent with Fermi surfaces originating mainly from the dxy, dxz, and dyz orbitals in these materials.

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  • Received 17 January 2012

DOI:https://doi.org/10.1103/PhysRevB.85.214518

©2012 American Physical Society

Authors & Affiliations

X.-P. Wang1, P. Richard1, Y.-B. Huang1, H. Miao1, L. Cevey1,2, N. Xu1, Y.-J. Sun1, T. Qian1, Y.-M. Xu3, M. Shi4, J.-P. Hu1,5, X. Dai1, and H. Ding1,*

  • 1Beijing National Laboratory for Condensed Matter Physics, and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • 2Laboratory for Quantum Magnetism, ICMP, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland
  • 3Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 4Paul Scherrer Institute, Swiss Light Source, CH-5232 Villigen PSI, Switzerland
  • 5Department of Physics, Purdue University, West Lafayette, Indiana 47907, USA

  • *dingh@iphy.ac.cn

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Vol. 85, Iss. 21 — 1 June 2012

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