• Editors' Suggestion
  • Rapid Communication

Quasifreestanding multilayer graphene films on the carbon face of SiC

D. A. Siegel, C. G. Hwang, A. V. Fedorov, and A. Lanzara
Phys. Rev. B 81, 241417(R) – Published 30 June 2010

Abstract

The electronic band structure of as-grown and doped graphene grown on the carbon face of SiC is studied by high-resolution angle-resolved photoemission spectroscopy, where we observe both rotations between adjacent layers and AB stacking. The band structure of quasifreestanding AB bilayers is directly compared with bilayer graphene grown on the Si face of SiC to study the impact of the substrate on the electronic properties of epitaxial graphene. Our results show that the C-face films are nearly free standing from an electronic point of view due to the rotations between graphene layers.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 4 March 2010

DOI:https://doi.org/10.1103/PhysRevB.81.241417

©2010 American Physical Society

Authors & Affiliations

D. A. Siegel1,2, C. G. Hwang2, A. V. Fedorov3, and A. Lanzara1,2,*

  • 1Department of Physics, University of California, Berkeley, California 94720, USA
  • 2Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 3Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • *Author to whom correspondence should be addressed; alanzara@lbl.gov

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 81, Iss. 24 — 15 June 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×