Abstract
Force-microscopy measurements are performed on the Si(111) surface. The 7×7 reconstruction is observed in the repulsive contact mode. With applied contact pressures of 1–10 GPa the reconstructed surface remains stable. Variations of frictional forces of the order of N are observed on the atomic scale.
- Received 1 November 1994
DOI:https://doi.org/10.1103/PhysRevB.51.5484
©1995 American Physical Society