Atomic-force microscopy on the Si(111)7×7 surface

L. Howald, R. Lüthi, E. Meyer, and H.-J. Güntherodt
Phys. Rev. B 51, 5484 – Published 15 February 1995
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Abstract

Force-microscopy measurements are performed on the Si(111) surface. The 7×7 reconstruction is observed in the repulsive contact mode. With applied contact pressures of 1–10 GPa the reconstructed surface remains stable. Variations of frictional forces of the order of 109 N are observed on the atomic scale.

  • Received 1 November 1994

DOI:https://doi.org/10.1103/PhysRevB.51.5484

©1995 American Physical Society

Authors & Affiliations

L. Howald, R. Lüthi, E. Meyer, and H.-J. Güntherodt

  • Institut für Physik, Universität Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland

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Vol. 51, Iss. 8 — 15 February 1995

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