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Reexamination of the Ag/Si(111)-√3 × √3 surface by scanning tunneling microscopy

K. J. Wan, X. F. Lin, and J. Nogami
Phys. Rev. B 45, 9509(R) – Published 15 April 1992
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Abstract

Scanning tunneling microscope images of the Ag/Si(111)-√3 × √3 surface have a strong dependence on bias-voltage polarity. Empty-state images show a characteristic honeycomb pattern with two maxima per unit cell. Filled-state images show protrusions in the positions of Ag atoms in the honeycomb-chain-trimer (HCT) model. These images strongly support recent electronic-structure calculations that are based on the HCT model for this surface. The registration of the √3 × √3 features relative to the underlying Si(111) substrate is also measured. As part of this determination, the step height between adjacent √3 × √3 and 7×7 areas is discussed in terms of the electronic structure of the two phases as measured by scanning tunneling spectroscopy.

  • Received 25 February 1992

DOI:https://doi.org/10.1103/PhysRevB.45.9509

©1992 American Physical Society

Authors & Affiliations

K. J. Wan, X. F. Lin, and J. Nogami

  • Department of Physics and the Laboratory for Surface Studies, University of Wisconsin–Milwaukee, Milwaukee, Wisconsin 53201

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Issue

Vol. 45, Iss. 16 — 15 April 1992

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