Energy gaps measured by scanning tunneling microscopy

Chen Wang, B. Giambattista, C. G. Slough, R. V. Coleman, and M. A. Subramanian
Phys. Rev. B 42, 8890 – Published 15 November 1990
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Abstract

A scanning tunneling microscope (STM) has been used to measure energy gaps in the charge-density-wave (CDW) phases of the layer-structure dichalcogenides and in the high-temperature superconductor Bi2Sr2CaCu2O8. Measured values of ΔCDW at 4.2 K for 2H-TaSe2, 2H-TaS2, and 2H-NbSe2 are 80, 50, and 34 meV giving values of 2ΔCDW/kBTc equal to 15.2, 15.4, and 23.9, indicating strong coupling in these CDW systems. Measured values of ΔCDW at 4.2 K in 1T-TaSe2 and 1T-TaS2 are ∼150 meV for both materials giving 2ΔCDW/kBTc≊5.8. STM scans of Bi2Sr2CaCu2O8 at 4.2 K resolve atoms on the BiOx layer and show possible variations in electronic structure. The energy gap determined from I versus V and dI/dV versus V curves is in the range 30–35 meV giving values of 2Δ/kBTc≊8. Spectroscopy measurements with the STM can exhibit large zero-bias anomalies which complicate the analysis of the energy-gap structure, but adequate separation has been accomplished.

  • Received 27 June 1990

DOI:https://doi.org/10.1103/PhysRevB.42.8890

©1990 American Physical Society

Authors & Affiliations

Chen Wang, B. Giambattista, C. G. Slough, and R. V. Coleman

  • Department of Physics, University of Virginia, Charlottesville, Virginia 22901

M. A. Subramanian

  • Central Research and Development Department, E. I. DuPont DeNemours Company, Wilmington, Delaware 19880-0356

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Issue

Vol. 42, Iss. 14 — 15 November 1990

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