Abstract
A new application of the delayed coincidence technique for measuring short nuclear lifetimes has been developed which is basically similar to the well-known prompt comparison method. Systematic errors can be reduced and greater accuracy obtained for nuclei which exhibit both a prompt and a delayed event. A transistorized time-to-amplitude converter was used. The mean life of the second excited state of [(4.8±0.3)× sec] and the first excited state of (<5× sec) were measured. Also the mean life of the first excited state of [(3.5±0.5)× sec] was determined by the usual self-comparison method.
- Received 11 October 1960
DOI:https://doi.org/10.1103/PhysRev.121.1169
©1961 American Physical Society