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Ferroelastically protected polarization switching pathways to control electrical conductivity in strain-graded ferroelectric nanoplates

Kwang-Eun Kim, Yong-Jin Kim, Yang Zhang, Fei Xue, Gi-Yeop Kim, Kyung Song, Si-Young Choi, Jun-Ming Liu, Long-Qing Chen, and Chan-Ho Yang
Phys. Rev. Materials 2, 084412 – Published 27 August 2018
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Abstract

Controllable local electronic conduction in otherwise insulating materials can be created by arranging two opponent ferroelectric polarizations in a head to head (or tail to tail) configuration. Using an effective trailing field of dc biased tip motion, charged domain walls have been artificially created in the context of tip-based nanolithography. However, the charged domain wall formed by a trailing field is unstable because of elastic interaction at the boundary between poling and nonpoling regions, finally resulting in ferroelastic back-switching. Here, we report that nanoscale plate structures under strain relaxation can provide a promising opportunity for stabilization and manipulation of a charged domain wall using a highly anisotropic mechanical boundary condition that restricts the unique ferroelastic domain configuration. We demonstrate that a ferroelectric BiFeO3 nanoplate subjected to compressive misfit strain at the bottom but less external stress on the side walls exhibits radial-quadrant in-plane ferroelectric domain structures. Electronic conduction is significantly enhanced near the side walls and the magnitude of electrostatic conductivity is adjustable up to about 20 times by 180° ferroelectric switching that is protected by the clamped ferroelastic domain. Our findings provide a pathway to controllable nanoelectronic logic devices by tuning a charged ferroelectric domain wall.

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  • Received 9 June 2018

DOI:https://doi.org/10.1103/PhysRevMaterials.2.084412

©2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Kwang-Eun Kim1, Yong-Jin Kim1, Yang Zhang2,3, Fei Xue2, Gi-Yeop Kim4, Kyung Song5, Si-Young Choi4,5, Jun-Ming Liu3,6, Long-Qing Chen2, and Chan-Ho Yang1,7,*

  • 1Department of Physics and Center for Lattice Defectronics, Korea Advanced Institute of Science and Technology, Yuseong-gu, Daejeon 34141, Republic of Korea
  • 2Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
  • 3Laboratory of Solid State Microstructures, Nanjing University and Innovation Center of Advanced Microstructures, Nanjing 210093, People's Republic of China
  • 4Department of Materials Science and Engineering, POSTECH, Pohang, Gyeongbuk 37673, Republic of Korea
  • 5Department of Materials Modeling and Characterization, Korea Institute of Materials Science, Changwon, Gyeongnam 51508, Republic of Korea
  • 6Institute for Advanced Materials, South China Academy of Advanced Optoelectronics and Guangdong Provincial Laboratory of Quantum Engineering and Quantum Materials, South China Normal University, Guangzhou 510006, People's Republic of China
  • 7Institute for the NanoCentury, Korea Advanced Institute of Science and Technology, Yuseong-gu, Daejeon 34141, Republic of Korea

  • *Corresponding author: chyang@kaist.ac.kr

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Issue

Vol. 2, Iss. 8 — August 2018

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