Soft X-Ray Resonant Magnetic Scattering from a Magnetically Coupled Ag /Ni Multilayer

J. M. Tonnerre, L. Sève, D. Raoux, G. Soullié, B. Rodmacq, and P. Wolfers
Phys. Rev. Lett. 75, 740 – Published 24 July 1995
PDFExport Citation

Abstract

X-ray resonant magnetic scattering experiments using linear and circular polarized light were performed at the Ni L2,3 absorption edges on a Ag /Ni multilayer. A superlattice magnetic peak, due to the antiferromagnetic coupling between Ni layers, is evidenced. In the case of a ferromagnetic coupling, large changes in the charge peak (up to 15%) are observed upon reversal of the direction of the magnetic field. The magnetic scattering amplitude is evaluated to 8r0 per nickel atom. Sum rules have been applied for the first time to the energy-dependent magnetic amplitude.

  • Received 27 February 1995

DOI:https://doi.org/10.1103/PhysRevLett.75.740

©1995 American Physical Society

Authors & Affiliations

J. M. Tonnerre1, L. Sève1, D. Raoux1, G. Soullié2,3, B. Rodmacq4, and P. Wolfers1

  • 1Laboratoire de Cristallographie, Centre National de la Recherche Scientifique, Université J. Fourier, B.P. 166, 38042 Grenoble Cédex 09, France
  • 2Laboratoire de Chimie-Physique, Centre National de la Recherche Scientifique, Université Pierre et Marie Curie, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
  • 3Laboratoire pour l'Utilisation du Rayonnement Electromagnétique, Centre National de la Recherche Scientifique, Commissariate à l'Energie Atomique, MESR, Bât 209D, Centre Universitaire Paris-Sud, 91405 Orsay Cedex, France
  • 4Commissariate à l'Energie Atomique, DRFMC, SP2M-MP, BP 85, 38054 Grenoble Cedex 9, France

References (Subscription Required)

Click to Expand
Issue

Vol. 75, Iss. 4 — 24 July 1995

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×