Observation and structural determination of (√3×√3)<i>R</i>30° reconstruction of the Si(111) surface

W. C. Fan; A. Ignatiev; H. Huang; S. Y. Tong

doi:10.1103/PhysRevLett.62.1516

Observation and structural determination of (√3×√3)R30° reconstruction of the Si(111) surface

W. C. Fan, A. Ignatiev, H. Huang, and S. Y. Tong

Phys. Rev. Lett. 62, 1516 – Published 27 March 1989

Abstract

A new reconstruction structure, having a √3×√3)R30° unit cell, is reported for the Si(111) surface. Analysis of low-energy electron-diffraction intensity spectra by multiple-scattering theory revealed a vacancy model. The bonds between the first- and second-layer atoms are of the ${sp}^{2}$ type, resulting in a highly compressed surface bilayer. Measured intensity spectra of the clean and Ag-deposited (√3×√2)R30° surfaces are very similar. This leads us to conclude that the Ag-Si interface is not sharp and that the Ag atoms do not form a lattice structure that has long-range ordering.