Disorder and the Optical-Absorption Edge of Hydrogenated Amorphous Silicon

G. D. Cody, T. Tiedje, B. Abeles, B. Brooks, and Y. Goldstein
Phys. Rev. Lett. 47, 1480 – Published 16 November 1981
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Abstract

The effect of thermal and structural disorder on the electronic structure of hydrogenated amorphous silicon is investigated by measurement of the shape of the optical absorption edge as a function of temperature and thermal evolution of hydrogen. The data are consistent with the idea that the thermal and structural disorder are additive, and suggest that the disorder, rather than the hydrogen content, is the fundamental determining factor in the optical band gap.

  • Received 11 May 1981

DOI:https://doi.org/10.1103/PhysRevLett.47.1480

©1981 American Physical Society

Authors & Affiliations

G. D. Cody, T. Tiedje, B. Abeles, B. Brooks, and Y. Goldstein

  • Corporate Research-Science Laboratories, Exxon Research and Engineering Company, Linden, New Jersey 07036

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Issue

Vol. 47, Iss. 20 — 16 November 1981

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