Abstract
The (220) lattice plane spacing of an almost perfect crystal of silicon was measured by means of a combined scanning () x-ray interferometer and a two-beam optical interferometer. From 170 measurements, a value fm results in vacuum at 22.50°C. This value is smaller by than that reported by Deslattes et al. for another crystal. Generic variabilities of the two crystals account only for a part of this difference.
- Received 3 February 1981
DOI:https://doi.org/10.1103/PhysRevLett.46.1540
©1981 American Physical Society