Geometry-Dependent Si(2p) Surface Core-Level Excitations for Si(111) and Si(100) Surfaces

F. J. Himpsel, P. Heimann, T. -C. Chiang, and D. E. Eastman
Phys. Rev. Lett. 45, 1112 – Published 29 September 1980; Erratum Phys. Rev. Lett. 46, 1602 (1981)
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Abstract

Structure-dependent Si(2p) surface core-level shifts and 2p photothreshold spectra which yield new surface geometry information are reported. For Si(100)-(2×1), ∼0.5 monolayer of surface atoms are found shifted to smaller binding energy (-0.5 eV) relative to the bulk; this rules out symmetric pairing models. Si(111)-(7×7) and Si(111)-(2×1) show different surface 2p core-level spectra (e.g., 16 layer shifted -0.7 eV versus ½ layer shifted - 0.4 eV), suggesting different geometries. Si(111)-(1×1)H exhibits first-layer (+ 0.26 eV) and second-layer (+ 0.15 eV) shifts.

  • Received 27 June 1980

DOI:https://doi.org/10.1103/PhysRevLett.45.1112

©1980 American Physical Society

Erratum

Geometry-Dependent Si(2p) Surface Core-Level Excitations for Si(111) and Si(100) Surfaces

F. J. Himpsel, P. Heimann, T. -C. Chiang, and D. E. Eastman
Phys. Rev. Lett. 46, 1602 (1981)

Authors & Affiliations

F. J. Himpsel, P. Heimann, T. -C. Chiang, and D. E. Eastman

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 45, Iss. 13 — 29 September 1980

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