Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip

Matthias Emmrich, Maximilian Schneiderbauer, Ferdinand Huber, Alfred J. Weymouth, Norio Okabayashi, and Franz J. Giessibl
Phys. Rev. Lett. 114, 146101 – Published 6 April 2015
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Abstract

We study the physics of atomic manipulation of CO on a Cu(111) surface by combined scanning tunneling microscopy and atomic force microscopy at liquid helium temperatures. In atomic manipulation, an adsorbed atom or molecule is arranged on the surface using the interaction of the adsorbate with substrate and tip. While previous experiments are consistent with a linear superposition model of tip and substrate forces, we find that the force threshold depends on the force field of the tip. Here, we use carbon monoxide front atom identification (COFI) to characterize the tip’s force field. Tips that show COFI profiles with an attractive center can manipulate CO in any direction while tips with a repulsive center can only manipulate in certain directions. The force thresholds are independent of bias voltage in a range from 1 to 10 mV and independent of temperature in a range of 4.5 to 7.5 K.

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  • Received 18 November 2014

DOI:https://doi.org/10.1103/PhysRevLett.114.146101

© 2015 American Physical Society

Authors & Affiliations

Matthias Emmrich1,*, Maximilian Schneiderbauer1, Ferdinand Huber1, Alfred J. Weymouth1, Norio Okabayashi2, and Franz J. Giessibl1

  • 1Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany
  • 2Graduate School of Natural Science and Technology, Kanazawa University, Kakuma-machi, Kanazawa, Ishikawa 920-1192, Japan

  • *matthias.emmrich@ur.de

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Vol. 114, Iss. 14 — 10 April 2015

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