Scale-Invariant Quantum Anomalous Hall Effect in Magnetic Topological Insulators beyond the Two-Dimensional Limit

Xufeng Kou, Shih-Ting Guo, Yabin Fan, Lei Pan, Murong Lang, Ying Jiang, Qiming Shao, Tianxiao Nie, Koichi Murata, Jianshi Tang, Yong Wang, Liang He, Ting-Kuo Lee, Wei-Li Lee, and Kang L. Wang
Phys. Rev. Lett. 113, 137201 – Published 26 September 2014; Erratum Phys. Rev. Lett. 113, 199901 (2014)
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Abstract

We investigate the quantum anomalous Hall effect (QAHE) and related chiral transport in the millimeter-size (Cr0.12Bi0.26Sb0.62)2Te3 films. With high sample quality and robust magnetism at low temperatures, the quantized Hall conductance of e2/h is found to persist even when the film thickness is beyond the two-dimensional (2D) hybridization limit. Meanwhile, the Chern insulator-featured chiral edge conduction is manifested by the nonlocal transport measurements. In contrast to the 2D hybridized thin film, an additional weakly field-dependent longitudinal resistance is observed in the ten-quintuple-layer film, suggesting the influence of the film thickness on the dissipative edge channel in the QAHE regime. The extension of the QAHE into the three-dimensional thickness region addresses the universality of this quantum transport phenomenon and motivates the exploration of new QAHE phases with tunable Chern numbers. In addition, the observation of scale-invariant dissipationless chiral propagation on a macroscopic scale makes a major stride towards ideal low-power interconnect applications.

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  • Received 26 May 2014

DOI:https://doi.org/10.1103/PhysRevLett.113.137201

© 2014 American Physical Society

Erratum

Erratum: Scale-Invariant Quantum Anomalous Hall Effect in Magnetic Topological Insulators beyond the Two-Dimensional Limit [Phys. Rev. Lett. 113, 137201 (2014)]

Xufeng Kou, Shih-Ting Guo, Yabin Fan, Lei Pan, Murong Lang, Ying Jiang, Qiming Shao, Tianxiao Nie, Koichi Murata, Jianshi Tang, Yong Wang, Liang He, Ting-Kuo Lee, Wei-Li Lee, and Kang L. Wang
Phys. Rev. Lett. 113, 199901 (2014)

Authors & Affiliations

Xufeng Kou1, Shih-Ting Guo2, Yabin Fan1, Lei Pan1, Murong Lang1, Ying Jiang3, Qiming Shao1, Tianxiao Nie1, Koichi Murata1, Jianshi Tang1, Yong Wang3, Liang He1, Ting-Kuo Lee2, Wei-Li Lee2,*, and Kang L. Wang1,†

  • 1Department of Electrical Engineering, University of California, Los Angeles, California 90095, USA
  • 2Institute of Physics, Academia Sinica, Taipei 11529, Taiwan
  • 3Center for Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

  • *Corresponding author. wlee@phys.sinica.edu.tw
  • Corresponding author. wang@seas.ucla.edu

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Issue

Vol. 113, Iss. 13 — 26 September 2014

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