Measurement of the Spin Relaxation Time of Single Electrons in a Silicon Metal-Oxide-Semiconductor-Based Quantum Dot

M. Xiao, M. G. House, and H. W. Jiang
Phys. Rev. Lett. 104, 096801 – Published 2 March 2010

Abstract

We demonstrate direct detection of individual electron spin states, together with measurement of spin relaxation time (T1), in silicon metal-oxide-semiconductor-based quantum dots (QD). Excited state spectroscopy of the QD has been performed using a charge-sensing technique. T1 of single spin excited states has been done in the time domain by a pump-and-probe method. For an odd and an even number of electrons, we found a magnetic field dependent and invariant T1, respectively.

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  • Received 1 October 2009

DOI:https://doi.org/10.1103/PhysRevLett.104.096801

©2010 American Physical Society

Authors & Affiliations

M. Xiao*, M. G. House, and H. W. Jiang

  • Department of Physics and Astronomy, University of California at Los Angeles, 405 Hilgard Avenue, Los Angeles, California 90095, USA

  • *mingx@physics.ucla.edu

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Vol. 104, Iss. 9 — 5 March 2010

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