Viscoelasticity of randomly branched polymers in the vulcanization class

Charles P. Lusignan, Thomas H. Mourey, John C. Wilson, and Ralph H. Colby
Phys. Rev. E 60, 5657 – Published 1 November 1999
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Abstract

We report viscosity, recoverable compliance, and molar mass distribution for a series of randomly branched polyester samples with long linear chain sections between branch points. Molecular structure characterization determines τ=2.47±0.05 for the exponent controlling the molar mass distribution, so this system belongs to the vulcanization (mean-field) universality class. Consequently, branched polymers of similar size strongly overlap and form interchain entanglements. The viscosity diverges at the gel point with an exponent s=6.1±0.3, that is significantly larger than the value of 1.33 predicted by the branched polymer Rouse model (bead-spring model without entanglements). The recoverable compliance diverges at the percolation threshold with an exponent t=3.2±0.2. This effect is consistent with the idea that each branched polymer of size equal to the correlation length stores kBT of elastic energy. Near the gel point, the complex shear modulus is a power law in frequency with an exponent u=0.33±0.05. The measured rheological exponents confirm that the dynamic scaling law u=t/(s+t) holds for the vulcanization class. Since s is larger and u is smaller than the Rouse values observed in systems that belong to the critical percolation universality class, we conclude that entanglements profoundly increase the longest relaxation time. Examination of the literature data reveals clear trends for the exponents s and u as functions of the chain length between branch points. These dependencies, qualitatively explained by hierarchical relaxation models, imply that the dynamic scaling observed in systems that belong to the vulcanization class is nonuniversal.

  • Received 24 August 1998

DOI:https://doi.org/10.1103/PhysRevE.60.5657

©1999 American Physical Society

Authors & Affiliations

Charles P. Lusignan*

  • Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627

Thomas H. Mourey

  • Imaging Research and Advanced Development-Materials, Eastman Kodak Company, Rochester, New York 14650-2136

John C. Wilson

  • Office Imaging, Eastman Kodak Company, Rochester, New York 14650-2129

Ralph H. Colby

  • Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802

  • *Author to whom correspondence should be addressed. Present address: Imaging Research and Advanced Development-Materials, Eastman Kodak Company, Rochester, NY 14650-2109.
  • Present address: Heidelberg Digital, LLC, Rochester, NY 14650.

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Vol. 60, Iss. 5 — November 1999

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