Long-distance coherent tunneling effect on the charge and heat currents in serially coupled triple quantum dots

David M. T. Kuo and Yia-chung Chang
Phys. Rev. B 89, 115416 – Published 14 March 2014

Abstract

The effect of long-distance coherent tunneling (LDCT) on the charge and heat currents in serially coupled triple quantum dots (TQDs) connected to electrodes is illustrated by using a combination of the extended Hurbbard and Anderson models. The charge and heat currents are calculated with a closed-form Landauer expression for the transmission coefficient suitable for the Coulomb blockade regime. The physical parameters including bias-dependent quantum dot energy levels, electron Coulomb interactions, and electron hopping strengths are calculated in the framework of effective mass theory for semiconductor TQDs. We demonstrate that the effect of LDCT on the charge and heat currents can be robust. In addition, it is shown that prominent heat rectification behavior can exist in the TQD system with asymmetrical energy levels.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 10 September 2013
  • Revised 6 March 2014

DOI:https://doi.org/10.1103/PhysRevB.89.115416

©2014 American Physical Society

Authors & Affiliations

David M. T. Kuo1,* and Yia-chung Chang2,3,†

  • 1Department of Electrical Engineering and Department of Physics, National Central University, Chungli 320, Taiwan
  • 2Research Center for Applied Sciences, Academic Sinica, Taipei 11529, Taiwan
  • 3Department of Physics, National Cheng Kung University, Tainan 701, Taiwan

  • *mtkuo@ee.ncu.edu.tw
  • yiachang@gate.sinica.edu.tw

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 89, Iss. 11 — 15 March 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×