Electronic inhomogeneity in n- and p-type PbTe detected by 125Te NMR

E. M. Levin, J. P. Heremans, M. G. Kanatzidis, and K. Schmidt-Rohr
Phys. Rev. B 88, 115211 – Published 30 September 2013

Abstract

125Te nuclear magnetic resonance spectra and spin-lattice relaxation of n- and p-type PbTe, self-doping narrow band-gap semiconductors, have been studied and compared to those of p-type GeTe. Spin-lattice relaxation in GeTe can be fit by one component, while that in both PbTe samples must be fit by at least two components, showing electronically homogeneous and inhomogeneous materials, respectively. For PbTe-based materials, the spin-lattice relaxation rate 1/T1 increases linearly with carrier concentration. The data for GeTe fall on the same line and allow us to extend this plot to higher concentrations. Long and short T1 components in both PbTe samples reflect “low,” ∼1017 cm3, and “high,” ∼1018 cm3, carrier concentration components. Carrier concentrations in both n- and p-type PbTe samples obtained from the Hall and Seebeck effects generally match the “high” carrier concentration component, and to some extent, ignore the “low” one. This demonstrates that the Hall and Seebeck effects may have a limited ability for the determination of carrier concentration in complex thermoelectric PbTe-based and other multicomponent materials.

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  • Received 16 July 2013

DOI:https://doi.org/10.1103/PhysRevB.88.115211

©2013 American Physical Society

Authors & Affiliations

E. M. Levin1,2,*, J. P. Heremans3,4, M. G. Kanatzidis5,6, and K. Schmidt-Rohr1,7

  • 1Division of Materials Sciences and Engineering, Ames Laboratory US Department of Energy (DOE), Ames, Iowa 50011, USA
  • 2Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011, USA
  • 3Department of Physics, Ohio State University, Columbus, Ohio 43210, USA
  • 4Department of Mechanical and Aerospace Engineering, Ohio State University, Columbus, Ohio 43210, USA
  • 5Department of Chemistry, Northwestern University, Evanston, Illinois 60208, USA
  • 6Division of Materials Sciences, Argonne National Laboratory US DOE, Argonne, Illinois 60439, USA
  • 7Department of Chemistry, Iowa State University, Ames, Iowa 50011, USA

  • *Corresponding author: levin@iastate.edu

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Vol. 88, Iss. 11 — 15 September 2013

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