Epitaxial Si1xGex alloys studied by spin-polarized photoemission

A. Ferrari, F. Bottegoni, G. Isella, S. Cecchi, and F. Ciccacci
Phys. Rev. B 88, 115209 – Published 20 September 2013

Abstract

Spin-polarized photoemission is used to study Si1xGex alloys epitaxially grown on a Si substrate. Spin-oriented electrons are generated in the conduction band upon excitation with circularly polarized light. We prove that in these structures it is possible to lower the vacuum level of the system below the conduction band minimum at the Γ point of the Brillouin zone and show that electron spin polarization values P=40±3% can be achieved when promoting electrons with direct transitions at Γ. Such values can be greatly increased, up to P=72±3%, in compressively strained thin epitaxial films, thus obtaining performances very close to those of III-V semiconductor heterostructures.

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  • Received 10 June 2013

DOI:https://doi.org/10.1103/PhysRevB.88.115209

©2013 American Physical Society

Authors & Affiliations

A. Ferrari*, F. Bottegoni, G. Isella, S. Cecchi, and F. Ciccacci

  • LNESS-Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy

  • *alberto.ferrari@mail.polimi.it

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Vol. 88, Iss. 11 — 15 September 2013

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