From point to extended defects in two-dimensional MoS2: Evolution of atomic structure under electron irradiation

Hannu-Pekka Komsa, Simon Kurasch, Ossi Lehtinen, Ute Kaiser, and Arkady V. Krasheninnikov
Phys. Rev. B 88, 035301 – Published 2 July 2013

Abstract

By combining high-resolution transmission electron microscopy experiments and first-principles calculations, we study production, diffusion, and agglomeration of sulfur vacancies in monolayer MoS2 under electron irradiation. Single vacancies are found to be mobile under the electron beam and tend to agglomerate into lines. Different kinds of such extended defects are identified in the experiments, and their atomic structures and electronic properties are determined with the help of calculations. The orientation of line defects is found to be sensitive to mechanical strain. Our calculations also indicate that the electronic properties of the extended defects can be tuned by filling vacancy lines with other atomic species, thereby suggesting a way for strain and electron-beam-assisted engineering of MoS2-based nanostructures.

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  • Received 12 April 2013

DOI:https://doi.org/10.1103/PhysRevB.88.035301

©2013 American Physical Society

Authors & Affiliations

Hannu-Pekka Komsa1, Simon Kurasch2, Ossi Lehtinen2, Ute Kaiser2, and Arkady V. Krasheninnikov1,3

  • 1Department of Physics, University of Helsinki, P.O. Box 43, 00014 Helsinki, Finland
  • 2Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, University of Ulm, 89081 Ulm, Germany
  • 3Department of Applied Physics, Aalto University, P.O. Box 11100, 00076 Aalto, Finland

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Vol. 88, Iss. 3 — 15 July 2013

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