Electron scattering by a steplike defect in topological insulator nanofilms

Thakshila M. Herath, Prabath Hewageegana, and Vadym Apalkov
Phys. Rev. B 87, 075318 – Published 21 February 2013

Abstract

We study the properties of a steplike defect on the surface of ultrathin topological insulator nanofilms. We calculate the reflectance of an electron from such a defect for different parameters of the nanofilm and different parameters of the defect. We show that an electron incident on a steplike defect not only produces reflected and transmitted waves but also generates the modes, which are localized at the steplike defect. Such modes result in an enhancement of electron density at the defect by 60%. The magnitude of the enhancement depends on the parameters of the nanofilm and the height of the step and is the largest in the case of total electron reflection.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 3 December 2012

DOI:https://doi.org/10.1103/PhysRevB.87.075318

©2013 American Physical Society

Authors & Affiliations

Thakshila M. Herath1, Prabath Hewageegana2, and Vadym Apalkov1

  • 1Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA
  • 2Department of Physics, University of Kelaniya, Kelaniya 11600, Sri Lanka

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 87, Iss. 7 — 15 February 2013

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×