Atomic effective pseudopotentials for semiconductors

J. R. Cárdenas and G. Bester
Phys. Rev. B 86, 115332 – Published 27 September 2012

Abstract

We derive an analytic connection between the screened self-consistent effective potential from density-functional theory (DFT) and atomic effective pseudopotentials (AEPs). The motivation to derive AEPs is to address structures with thousands to hundreds of thousands of atoms, as given in most nanostructures. The use of AEPs allows us to bypass a self-consistent procedure and to address eigenstates around a certain region of the spectrum (e.g., around the band gap). The bulk AEP construction requires two simple DFT calculations of slightly deformed elongated cells. The ensuing AEPs are given on a fine reciprocal space grid, including the small reciprocal vector components, are free of adjustable parameters, and involve no fitting procedure. We further show how to connect the AEPs of different bulk materials, which is necessary to obtain accurate band offsets. We derive a total of 20 AEPs for group-III-V, II-VI, and IV semiconductors and demonstrate their accuracy and transferability by comparison to DFT calculations of strained bulk structures, quantum wells with varying thickness, and semiconductor alloys.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 13 June 2012

DOI:https://doi.org/10.1103/PhysRevB.86.115332

©2012 American Physical Society

Authors & Affiliations

J. R. Cárdenas and G. Bester*

  • Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, D-70569 Stuttgart, Germany

  • *g.bester@fkf.mpg.de

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 86, Iss. 11 — 15 September 2012

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×