Ab initio study of height contrast in scanning tunneling microscopy of Ge/Si surface layers grown on Si(111) in presence of Bi

Ruslan Zhachuk and José Coutinho
Phys. Rev. B 84, 193405 – Published 14 November 2011

Abstract

It has been recently demonstrated that Bi surfactants over Ge layers grown on Si(111) allow us to distinguish Ge and Si covered regions through a scanning tunneling microscope. We revised this problem by considering geometric (or structural) and electronic effects to explain the measured apparent height difference of relaxed surface layers. The local density of states and related decay lengths into vacuum are calculated within density functional theory for each surface of interest. The results are compared with recent experimental data from a scanning tunneling spectroscopy study [J. Mysliveček, F. Dvořák, A. Stróżecka, and B. Voigtländer, Phys. Rev. B 81, 245427 (2010)].

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  • Received 14 July 2011

DOI:https://doi.org/10.1103/PhysRevB.84.193405

©2011 American Physical Society

Authors & Affiliations

Ruslan Zhachuk1,2,* and José Coutinho2

  • 1Institute of Semiconductor Physics, pr. Lavrentyeva 13, Novosibirsk 630090, Russia
  • 2I3N, Department of Physics, University of Aveiro, Campus Santiago, P-3810-193 Aveiro, Portugal

  • *zhachuk@gmail.com

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Issue

Vol. 84, Iss. 19 — 15 November 2011

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