Abstract
We performed in situ angle-resolved photoemission spectroscopy measurements on thin and ultrathin films deposited onto substrates in order to determine their electronic band structure. We directly identified, in ultrathin films, an enhancement of the occupation of the out-of-plane band at the expense of the in-plane band. Such a disproportionate change in orbital occupation is interpreted as the origin of the strong depression of the magnetotransport properties at the interface between manganite films and substrates.
- Received 14 March 2010
DOI:https://doi.org/10.1103/PhysRevB.82.214407
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