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Characterization of octadecaborane implantation into Si using molecular dynamics

Luis A. Marqués, Lourdes Pelaz, Iván Santos, and V. C. Venezia
Phys. Rev. B 74, 201201(R) – Published 22 November 2006

Abstract

We carried out molecular dynamics simulations of monatomic B and octadecaborane cluster implantations into Si. We obtained and analyzed the doping profiles, lateral straggling and the damage amount and morphology produced within the target, as well as its annealing behavior. Our simulation results indicate that the use of octadecaborane clusters for the fabrication of ultrashallow junctions shows several advantages with respect to monatomic B beams, mainly related to target self-amorphization which reduces channeling and the amount of residual damage at the end of range.

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  • Received 4 October 2006

DOI:https://doi.org/10.1103/PhysRevB.74.201201

©2006 American Physical Society

Authors & Affiliations

Luis A. Marqués*, Lourdes Pelaz, and Iván Santos

  • Departamento de Electrónica, Universidad de Valladolid, E.T.S.I. de Telecomunicación, 47011 Valladolid, Spain

V. C. Venezia

  • Axcelis Technologies, Beverly, Massachusetts 01915, USA

  • *Electronic address: lmarques@ele.uva.es
  • Present address: OmniVision Technologies, Inc., Sunnyvale, CA 94089.

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Issue

Vol. 74, Iss. 20 — 15 November 2006

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