Ab initio study of Al-ceramic interfacial adhesion

Donald J. Siegel, Louis G. Hector, Jr., and James B. Adams
Phys. Rev. B 67, 092105 – Published 26 March 2003
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Abstract

We present a small database of adhesion energies for Al/ceramic interfaces calculated using density functional methods. In total, 26 distinct interface geometries were examined, in which the ceramic component was varied amongst carbides (WC, VC), nitrides (VN, CrN, TiN), and oxides (αAl2O3), while including variations in interfacial stacking sequence and ceramic termination (polar and nonpolar). We find that adhesion is smallest (largest) for those interfaces constructed from non-polar (polar) surfaces, regardless of ceramic component. Since the interfacial free energies of all interfaces are relatively small, we examine the extent to which adhesion can be described solely by contributions from the surface energies.

  • Received 20 May 2002

DOI:https://doi.org/10.1103/PhysRevB.67.092105

©2003 American Physical Society

Authors & Affiliations

Donald J. Siegel1,*,†, Louis G. Hector, Jr.2, and James B. Adams3

  • 1Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801
  • 2Materials and Processes Laboratory, Mail Code 480-106-224, General Motors Research and Development Center, 30500 Mound Road, Warren, Michigan 48090-9055
  • 3Chemical and Materials Engineering Department, Arizona State University, Tempe, Arizona 85287-6006

  • *Email address: djsiege@sandia.gov
  • Current address: Sandia National Laboratories, Mail Stop 9161, Livermore, CA 94551.

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Vol. 67, Iss. 9 — 1 March 2003

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