Energy distribution in Ge islands on Si(001): A spectral and site-resolved analysis versus size and morphology

P. Raiteri and Leo Miglio
Phys. Rev. B 66, 235408 – Published 16 December 2002
PDFExport Citation

Abstract

By a spectral and site-resolved analysis of the energy distribution (both stress and surface originated) at the atomistic scale, calculated by classical molecular dynamics for Ge islands with different morphologies on Si(001), we show how domes actually provide the largest strain release. Moreover, we point out that the usual partition of the total energy into a volume plus a surface contribution also corresponds to two separate spectral energy regions, which are the same in any morphology. However, it turns out that the volume-scaling contribution is quite complex and that the real strain relaxation term corresponds to the lower part of the energy spectrum, not scaling as the volume for small island size.

  • Received 1 July 2002

DOI:https://doi.org/10.1103/PhysRevB.66.235408

©2002 American Physical Society

Authors & Affiliations

P. Raiteri* and Leo Miglio

  • INFM and Dipartimento di Scienza dei Materiali, Universitá degli Studi di Milano-Bicocca, Via Cozzi 53, I–20125 Milano, Italy

  • *Electronic address: paolo.raiteri@unimib.it

References (Subscription Required)

Click to Expand
Issue

Vol. 66, Iss. 23 — 15 December 2002

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×