Width of optical phonons: Influence of defects of various geometry

L. A. Falkovsky
Phys. Rev. B 64, 024301 – Published 18 June 2001
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Abstract

The interaction of phonon states with the point, line, and plane defects is considered near the edge of an optical-phonon branch. Because the effect of disorder on optical phonons is ordinarily studied in the Raman experiments, we calculate the averaged phonon Green’s function characterizing the Raman line shape. There are two frequency regions in the Raman spectra: the first involves excitations of an extended phonon mode and the second corresponds with a phonon state localized on defects. We find broadening and line-shape asymmetry of the extended mode due to scattering by defects. On the other hand, the contribution of localized states to Raman spectra has a form of shoulder with a width proportional to the square root of the defect concentration.

  • Received 19 December 2000

DOI:https://doi.org/10.1103/PhysRevB.64.024301

©2001 American Physical Society

Authors & Affiliations

L. A. Falkovsky*

  • Landau Institute for Theoretical Physics, 117337 Moscow, Russia and
  • Groupe d’Etudes des Semiconducteurs, cc074 UM2-CNRS, 34095 Montpellier, France

  • *Email address: falk@itp.ac.ru

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Vol. 64, Iss. 2 — 1 July 2001

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