Abstract
A dynamic contact mode operation of electrostatic-force microscopy (EFM) with an ac modulation has been developed and used to investigate the domain strucutre and dynamics of a triglycine sulfate single crystal. Well-separated topographic and domain contrast images have been obtained by detecting the force instead of the force gradient in the dynamic contact mode operation of EFM. Surface charge density and the anisotropic domain wall thickness have been measured. The evolution of domains embedded in an oppositely polarized larger domain indicates the existence of a significant interaction between domains of the same polarity.
- Received 5 December 1997
DOI:https://doi.org/10.1103/PhysRevB.58.5078
©1998 American Physical Society