Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy

J. W. Hong, K. H. Noh, Sang-il Park, S. I. Kwun, and Z. G. Khim
Phys. Rev. B 58, 5078 – Published 15 August 1998
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Abstract

A dynamic contact mode operation of electrostatic-force microscopy (EFM) with an ac modulation has been developed and used to investigate the domain strucutre and dynamics of a triglycine sulfate single crystal. Well-separated topographic and domain contrast images have been obtained by detecting the force instead of the force gradient in the dynamic contact mode operation of EFM. Surface charge density and the anisotropic domain wall thickness have been measured. The evolution of domains embedded in an oppositely polarized larger domain indicates the existence of a significant interaction between domains of the same polarity.

  • Received 5 December 1997

DOI:https://doi.org/10.1103/PhysRevB.58.5078

©1998 American Physical Society

Authors & Affiliations

J. W. Hong and K. H. Noh

  • Department of Physics and Condensed Matter Research Institute, Seoul National University, Seoul 151-742, Korea

Sang-il Park

  • PSIA Corporation, Seocho-dong 1600-3, Seoul 137-070, Korea

S. I. Kwun and Z. G. Khim

  • Department of Physics and Condensed Matter Research Institute, Seoul National University, Seoul 151-742, Korea

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Vol. 58, Iss. 8 — 15 August 1998

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