Abstract
The electrical resistivity (ρ), magnetoresistance (MR), Hall coefficient of thin film, and MR of polycrystalline samples have been studied over a wide temperature range and in high-magnetic fields up to 20 T. In the ferromagnetic (FM) phase, follows an expression with and without applied field. This temperature dependence may be understood on the basis of scattering of charge carriers due to spin fluctuations. At low temperatures, magnetoconductivity of increases linearly with up to 20 T whereas for deviation from linearity is observed in the high-field region. The Hall coefficient of shows strong temperature dependence due to the skew scattering by the magnetic moments and exhibited the temperature dependence principally due to that of the magnetization. The anomalous part of the Hall coefficient is zero at becomes negative with increasing temperature, and its magnitude is comparable with a normal component. The anomalous nature of the Hall resistivity is also reflected in the field dependence of The carrier density calculated from the normal Hall coefficient part is
- Received 6 November 1997
DOI:https://doi.org/10.1103/PhysRevB.57.10256
©1998 American Physical Society