uv Photoemission Measurements of the Upper d Levels in the IIB-VIA Compounds

C. J. Vesely, R. L. Hengehold, and D. W. Langer
Phys. Rev. B 5, 2296 – Published 15 March 1972
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Abstract

Photoemission measurements have been made of the upper d levels in ZnO, ZnSe, ZnTe, CdS, CdSe, CdTe, HgSe, and HgTe using 21.2-eV (584-Å) and 16.8-eV (740-Å) radiation. All the samples except for HgSe and HgTe were cleaved and measured in an oil-free ion-pumped vacuum system at a pressure in the 107-108 Torr range. The results agree extremely well with values obtained by x-ray-induced-electron-emission spectroscopy. The spectra obtained for HgSe and HgTe make it possible to positively verify the identification of certain peaks observed in photoemission spectra of the IIB-VIA compounds as being due to the upper d levels. The photoemission results reported in this study are also compared with both reflectivity and energy-loss measurements to obtain information about the optical density of states in the conduction bands of these compounds.

  • Received 15 November 1971

DOI:https://doi.org/10.1103/PhysRevB.5.2296

©1972 American Physical Society

Authors & Affiliations

C. J. Vesely

  • Aerospace Research Laboratories, Wright-Patterson Air Force Base, Ohio 45433

R. L. Hengehold

  • Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433

D. W. Langer

  • Aerospace Research Laboratories, Wright-Patterson Air Force Base, Ohio 45433

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Vol. 5, Iss. 6 — 15 March 1972

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