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Connection between the Meyer-Neldel relation and multiple-trapping transport

W. B. Jackson
Phys. Rev. B 38, 3595(R) – Published 15 August 1988
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Abstract

This paper shows that multiple-trapping-dominated transport quantities such as mobility and diffusion exhibit a Meyer-Neldel relation (MNR), an exponential relation between the prefactor of a thermally activated process and its activation energy. From these results, the Meyer-Neldel parameters can be related to the energy distribution of trapping sites and microscopic transport properties. The MNR for both the mobility of charge carriers and the annealing rate of metastable defects in hydrogenated amorphous silicon are quantitatively explained.

  • Received 24 May 1988

DOI:https://doi.org/10.1103/PhysRevB.38.3595

©1988 American Physical Society

Authors & Affiliations

W. B. Jackson

  • Xerox Palo Alto Research Center, Palo Alto, California 94304

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Vol. 38, Iss. 5 — 15 August 1988

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