• Rapid Communication

Examination of the cu/si(111) 5×5 structure by scanning tunneling microscopy

R. J. Wilson, S. Chiang, and F. Salvan
Phys. Rev. B 38, 12696(R) – Published 15 December 1988
PDFExport Citation

Abstract

The incommensurate 5×5 Cu/Si(111) structure has been examined by scanning tunneling microscopy. Images show that the surface structure is not well described as a hexagonal copper layer modulated at the Si(111) periodicity. Rather, the surface breaks up into 5×5 subunits which pack at spacings varying from 5 to 7 lattice constants, implying that substrate-adsorbate interactions dominate lateral interactions within the Cu adlayer.

  • Received 9 March 1988

DOI:https://doi.org/10.1103/PhysRevB.38.12696

©1988 American Physical Society

Authors & Affiliations

R. J. Wilson and S. Chiang

  • IBM Almaden Research Center, San Jose, California 95120-6099

F. Salvan

  • Unité associée au Centre National de la Recherche Scientifique No. 783, Faculté des Sciences de Luminy, Département de Physique, Case 901, F-13288 Marseille Cedex 9, France

References (Subscription Required)

Click to Expand
Issue

Vol. 38, Iss. 17 — 15 December 1988

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×