• Rapid Communication

Q factors of quartz oscillator modes as a probe of submonolayer-film dynamics

A. Widom and J. Krim
Phys. Rev. B 34, 1403(R) – Published 15 July 1986
PDFExport Citation

Abstract

That frequency shifts by quartz crystals oscillating in the transverse shear mode can be used to determine adsorption isotherms for monolayer and submonolayer adsorbed films is well understood. Here, the nature of the dynamical information contained in the quality factors of such modes is theoretically discussed.

  • Received 4 December 1985

DOI:https://doi.org/10.1103/PhysRevB.34.1403

©1986 American Physical Society

Authors & Affiliations

A. Widom and J. Krim

  • Physics Department, Northeastern University, Boston, Massachusetts 02115

References (Subscription Required)

Click to Expand
Issue

Vol. 34, Iss. 2 — 15 July 1986

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×