Optical absorption in amorphous Si films at high pressure

B. Welber and M. H. Brodsky
Phys. Rev. B 16, 3660 – Published 15 October 1977
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Abstract

We report the pressure-dependent optical absorption in the fundamental edge region of amorphous silicon prepared by sputtering and glow discharge methods. For pressures up to 20 kbar we find a negative pressure coefficient of about 1 × 106 eV/bar for the isoabsorption energies. In a higher range of pressure, starting with pressures of about 50 kbar, we observed irreversible red shifts in the absorption curves.

  • Received 9 February 1977

DOI:https://doi.org/10.1103/PhysRevB.16.3660

©1977 American Physical Society

Authors & Affiliations

B. Welber and M. H. Brodsky

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

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Issue

Vol. 16, Iss. 8 — 15 October 1977

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