Fano-Andreev effect in a parallel double quantum dot structure

Xiao-Qi Wang, Shu-Feng Zhang, Yu Han, and Wei-Jiang Gong
Phys. Rev. B 100, 115405 – Published 4 September 2019

Abstract

We investigate the Andreev reflection in a parallel double quantum dot structure, by considering one metallic lead coupled to one s-wave superconductor through the quantum dots. It is found that if an arm of this system provides the reference channel for the Andreev reflection, the Fano line shapes will have opportunities to appear in the linear conductance spectra and can be reversed by adjusting the dot level or local magnetic flux. To present the underlying physics, we obtain the Fano form of the linear conductance expression. Despite the complicated structural parameters, the property of the Fano effect is clearly shown. We believe that the results of this work will help us to understand the Fano interference in the Andreev reflection process.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
3 More
  • Received 18 December 2018
  • Revised 16 May 2019

DOI:https://doi.org/10.1103/PhysRevB.100.115405

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Xiao-Qi Wang1, Shu-Feng Zhang2, Yu Han3, and Wei-Jiang Gong1,*

  • 1College of Sciences, Northeastern University, Shenyang 110819, China
  • 2School of Physics and Technology, University of Jinan, Jinan, Shandong 250022, China
  • 3School of Physics, Liaoning University, Shenyang 110036, China

  • *Corresponding author: gwj@mail.neu.edu.cn

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 100, Iss. 11 — 15 September 2019

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×