Optimized entropic uncertainty for successive projective measurements

Kyunghyun Baek, Tristan Farrow, and Wonmin Son
Phys. Rev. A 89, 032108 – Published 10 March 2014

Abstract

We focus here on the uncertainty of an observable Y caused by a precise measurement of X. We illustrate the effect by analyzing the general scenario of two successive measurements of spin components X and Y. We derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of Y. We compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements.

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  • Received 4 December 2013

DOI:https://doi.org/10.1103/PhysRevA.89.032108

©2014 American Physical Society

Authors & Affiliations

Kyunghyun Baek1, Tristan Farrow2,3, and Wonmin Son1,*

  • 1Department of Physics, Sogang University, Mapo-gu, Shinsu-dong, Seoul 121-742, Korea
  • 2Atomic & Laser Physics, Clarendon Laboratory, University of Oxford, OX1 3PU, United Kingdom
  • 3Centre for Quantum Technologies, National University of Singapore, 3 Science Drive 2, 117543, Singapore

  • *sonwm71@sogang.ac.kr

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Vol. 89, Iss. 3 — March 2014

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