Abstract
Crossed beams of electrons and ions have been employed to measure absolute cross sections for 165.0-nm emission, corresponding to the transition . The emission cross section, which is nearly identical to the excitation cross section for near threshold, has a value of about 1.2 × at the 7.51-eV threshold, rises to a maximum of 2.26 × at 13 eV, and falls to 0.64 × at 274 eV. The cross section exhibits considerable structure in the energy region from threshold to the onset of the first cascade () at 11.9 eV; this structure is likely due to interference from autoionizing states of neutral Hg. The total uncertainty at a "good" confidence level is about 18%, taken as the quadrature sum of random uncertainty (5% at 90% confidence level) with systematic uncertainties (17% at a level equivalent to 90% confidence level). At threshold, the Gaunt-factor formula of Seaton predicts a value of about 3 times that measured, but the two converge to within about 15% for electron energies ranging from 13 to 274 eV. The results are also in reasonable agreement with a semiclassical Gryzinski-type calculation for energies above several times threshold. The data give an emission cross section of (2.8 ± 0.5) × at 6.8 eV for 194.2 nm (). Analysis of data taken with some metastable ions in the target beam indicates that the mean cross section for excitation of the level from the metastable states is larger than that for excitation from the ground state. Additional measurements of 398.4-nm emission () yield a cross section of about 6 × near threshold, and a branching ratio of .
- Received 25 November 1974
DOI:https://doi.org/10.1103/PhysRevA.11.1223
©1975 American Physical Society