Abstract
A 2D quasicrystal with an eightfold rotational axis has been found in rapidly solidified V-Ni-Si and Cr-Ni-Si alloys by means of transmission electron microscopy. The electron diffraction pattern taken along this axis shows no periodicity but a clear eightfold orientation symmetry. The corresponding high-resolution electron microscopic image agrees well with the 2D eightfold quasilattice consisting of squares and 45° rhombi.
- Received 12 May 1987
DOI:https://doi.org/10.1103/PhysRevLett.59.1010
©1987 American Physical Society