• Editors' Suggestion

Proximity-Induced Gap Opening by Twisted Plumbene in Epitaxial Graphene

Chitran Ghosal, Markus Gruschwitz, Julian Koch, Sibylle Gemming, and Christoph Tegenkamp
Phys. Rev. Lett. 129, 116802 – Published 8 September 2022

Abstract

Besides graphene, further honeycomb 2D structures were successfully synthesized on various surfaces. However, almost flat plumbene hosting topologically protected edge states could not yet be realized. In this Letter, we investigated the intercalation of Pb on buffer layers on SiC(0001). Thereby, suspended and charge neutral graphene emerged, and the intercalated Pb formed plumbene honeycomb lattices, which are rotated by ±7.5° with respect to graphene. Along with this twist, a proximity-induced modulation of the hopping parameter in graphene opens a band gap of around 30 meV at the Fermi energy, giving rise to a metal-insulator transition. Moreover, the edges of the intercalated plumbene layers revealed edge states within the gap of the conduction bands at around 1 eV as expected for charge neutral plumbene.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 10 April 2022
  • Accepted 17 August 2022

DOI:https://doi.org/10.1103/PhysRevLett.129.116802

© 2022 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Chitran Ghosal, Markus Gruschwitz, Julian Koch, Sibylle Gemming, and Christoph Tegenkamp*

  • Institut für Physik,Technische Universität Chemnitz, Reichenhainer Straße 70, 09126 Chemnitz, Germany

  • *christoph.tegenkamp@physik.tu-chemnitz.de

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 129, Iss. 11 — 9 September 2022

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×