Abstract
We report on a method significantly improving the energy resolution of dielectronic recombination (DR) measurements in electron beam ion traps (EBITs). The line width of DR resonances can be reduced to values distinctly smaller than the corresponding space charge width of the uncompensated electron beam. The experimental technique based on forced evaporative cooling is presented together with test measurements demonstrating its high efficiency. The principle for resolution improvement is elucidated and the limiting factors are discussed. This method opens access to high resolution DR measurements at high ion-electron collision energies required for innermost shell DR in highly charged ions (HCI).
Export citation and abstract BibTeX RIS