Paper

BETSEE: testing for system-wide effects of single event effects on ITk strip modules

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Published 12 January 2023 © 2023 IOP Publishing Ltd and Sissa Medialab
, , Citation C. Belanger-Champagne et al 2023 JINST 18 C01019 DOI 10.1088/1748-0221/18/01/C01019

1748-0221/18/01/C01019

Abstract

The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

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10.1088/1748-0221/18/01/C01019