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Combined AFM-TEM studies of amorphous-crystalline transformation and interface in thin films of Se and Fe2O3

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Published under licence by IOP Publishing Ltd
, , Citation V Yu Kolosov et al 2008 J. Phys.: Conf. Ser. 100 082037 DOI 10.1088/1742-6596/100/8/082037

1742-6596/100/8/082037

Abstract

Thin amorphous films of selenium and iron oxide were crystallized by local electron beam annealing. Two types of spherulite-like crystals grown (complicated by 'transrotational' lattice ordering) were studied by transmission electron microscopy (TEM) and atomic force microscopy (AFM) techniques. The regularities of change in lattice orientations and imperfection along the crystals obtained by TEM are analyzed in parallel with AFM data for the film surface (relief) of the crystal and amorphous surrounding.

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10.1088/1742-6596/100/8/082037