Abstract
Experiments were performed for the first time using the electronic square-wave voltage-perturbation test to systematically quantify the frequency response of near-wall hot-wire probes subjected in turn to varying magnitudes of convective velocity, different substrate materials and changes in wall-substrate temperature. In addition, quartz-substrate hot-film gauges with various thicknesses of quartz coating were also tested. Results of were compared against the dynamic frequency response previously obtained in parts I and II using a known near-wall fluctuating flow field. Although the observed trends for and were similar, their magnitudes were vastly different, notably for the commercially available hot-film gauges, or which was up to five orders of magnitude greater than . This signifies that there are possibly inherent differences between square-wave voltage-perturbation and velocity-perturbation tests for quantifying the frequency response of a hot-wire/hot-film system. These differences are then analysed in relation to the equation of a CTA unit put forth by Freymuth.
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