Abstract
Argon is one of the gases best investigated and most widely used in plasma discharge devices for a multitude of applications that range from wavelength reference standards to controlled fusion experiments. Reviewing atomic physics and spectroscopic problems in various ionization stages of Ar, the past use and future options of employing an electron beam ion trap (EBIT) for better and more complete Ar data in the x-ray, EUV and visible spectral ranges are discussed.
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