The (Nb + In) co-doped TiO2 ceramics recently attracted considerable attention due to their colossal dielectric permittivity (CP) (∼100,000) and low dielectric loss (∼0.05). In this research, the 0.5 mol. % In-only, 0.5 mol. % Nb-only, and 0.5–7 mol. % (Nb + In) co-doped TiO2 ceramics were synthesized by standard conventional solid-state reaction method. Microstructure studies showed that all samples were in pure rutile phase. The Nb and In ions were homogeneously distributed in the grain and grain boundary. Impedance spectroscopy and I-V behavior analysis demonstrated that the ceramics may compose of semiconducting grains and insulating grain boundaries. The high conductivity of grain was associated with the reduction of Ti4+ ions to Ti3+ ions, while the migration of oxygen vacancy may account for the conductivity of grain boundary. The effects of annealing treatment and bias filed on electrical properties were investigated for co-doped TiO2 ceramics, where the electric behaviors of samples were found to be susceptible to the annealing treatment and bias field. The internal-barrier-layer-capacitance mechanism was used to explain the CP phenomenon, the effect of annealing treatment and nonlinear I-V behavior for co-doped rutile TiO2 ceramics. Compared with CaCu3Ti4O12 ceramics, the high activation energy of co-doped rutile TiO2 (3.05 eV for grain boundary) was thought to be responsible for the low dielectric loss.
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21 August 2014
Research Article|
August 18 2014
Microstructure and dielectric properties of (Nb + In) co-doped rutile TiO2 ceramics
Jinglei Li;
Jinglei Li
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Fei Li;
Fei Li
a)
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Yongyong Zhuang;
Yongyong Zhuang
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Li Jin;
Li Jin
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Linghang Wang;
Linghang Wang
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Xiaoyong Wei;
Xiaoyong Wei
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Zhuo Xu;
Zhuo Xu
1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Centre for Dielectric Research,
Xi'an Jiaotong University
, Xi'an 710049, China
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Shujun Zhang
Shujun Zhang
b)
2Materials Research Institute,
Pennsylvania State University
, University Park, Pennsylvania 16802, USA
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J. Appl. Phys. 116, 074105 (2014)
Article history
Received:
July 14 2014
Accepted:
August 05 2014
Citation
Jinglei Li, Fei Li, Yongyong Zhuang, Li Jin, Linghang Wang, Xiaoyong Wei, Zhuo Xu, Shujun Zhang; Microstructure and dielectric properties of (Nb + In) co-doped rutile TiO2 ceramics. J. Appl. Phys. 21 August 2014; 116 (7): 074105. https://doi.org/10.1063/1.4893316
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