Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Tanlock carrier phase recovery without a divider and VCO

Tanlock carrier phase recovery without a divider and VCO

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Add to cart
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)
Add to cart

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

© IEE
Published

A novel approach for implementing the tanlock carrier phase estimator for binary phase-shift keyed signals is presented. The approach does not require the use of a divider which has been the main drawback in previous implementations. The estimator is open-loop and, thus, does not require a VCO.

Inspec keywords: demodulators; phase shift keying; demodulation; phase locked loops

Other keywords: carrier phase estimator; phase-shift keyed signals; tanlock carrier phase recovery; binary PSK signals; open-loop estimator

Subjects: Modulation and coding methods; Modulators, demodulators, discriminators and mixers

References

    1. 1)
      • A.H. Makarios , P.G. Farrell . Noise and false-lock performance of the PSK-Tanlock loop. IEEE Trans. Commun. , 2277 - 2284
    2. 2)
      • Robinson, L.M.: `Tanlock: A phase lock loop of extended tracking capabilities', Proc. Nat. Conf. Military Electron., February 1962, USA, p. 396–421.
    3. 3)
      • P.Y. Kam . Maximum likelihood carrier phase recovery for linear suppressed-carrierdigital data modulations. IEEE Trans. , 522 - 527
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19941332
Loading

Related content

content/journals/10.1049/el_19941332
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
Print this page
This is a required field
Please enter a valid email address