Issue 36, 2019
From the journal:

CrystEngComm

Nanoscale thermal mapping of few-layer organic crystals

Ying Zhang,†a   Cong Zhang,†b   Dacheng Wei, ORCID logo b   Xue Bai*a  and  Xiangfan Xu ORCID logo *ac  

* Corresponding authors

a Center for Phononics and Thermal Energy Science, China-EU Joint Center for Nanophononics, School of Physics Science and Engineering, Tongji University, 200092 Shanghai, China
E-mail: 18531@tongji.edu.cn, xuxiangfan@tongji.edu.cn

b State Key Laboratory of Molecular Engineering of Polymers, Department of Macromolecular Science, Fudan University, Shanghai 200433, China

c Zhejiang Province Key Laboratory of Quantum Technology and Device, Zhejiang University, Hangzhou 310027, China

Abstract

Thermal stability and thermal management are critical to the performance of organic transistors/solar cells. However, these properties are rarely studied due to the limited techniques for measuring the thermal conduction of organic thin-film crystals. Using an active mode scanning thermal microscope (SThM), we quantitatively measured the thermal map of layered 1,4-bis(4-methylstyryl)benzene (BSB-Me) thin-film crystals. The out-of-plane thermal conductivity was calculated to be ∼0.15–0.20 W m−1 K−1 by comparing the temperature distributions of the thermal probe with the results of COMSOL Multiphysics simulations. This thickness-dependent SThM measurement provides important thermal-transport information of organic thin-film devices, where thermal dissipation is crucial.

Graphical abstract: Nanoscale thermal mapping of few-layer organic crystals

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Article information

DOI
https://doi.org/10.1039/C9CE00827F
Article type
Paper
Submitted
29 May 2019
Accepted
17 Jul 2019
First published
18 Jul 2019

CrystEngComm, 2019,21, 5402-5409

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Nanoscale thermal mapping of few-layer organic crystals

Y. Zhang, C. Zhang, D. Wei, X. Bai and X. Xu, CrystEngComm, 2019, 21, 5402 DOI: 10.1039/C9CE00827F

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