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The Use of High-Energy Synchrotron Diffraction for Residual Stress Analyses

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Journal of Materials Science Letters

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Reimers, W., Pyzalla, A., Broda, M. et al. The Use of High-Energy Synchrotron Diffraction for Residual Stress Analyses. Journal of Materials Science Letters 18, 581–583 (1999). https://doi.org/10.1023/A:1006651217517

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  • DOI: https://doi.org/10.1023/A:1006651217517

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