References
V. Hauk and E. Macherauch Adv. X-ray Analysis 27 (1989) 81.
L. Pintschovius, in ``Measurement of residual and applied stress using neutron diffraction'', edited by M. Hutchings and A. Krawitz (Kluwer Academic Publishers, Dordrecht, 1989) p. 115.
A. J. Allen, M. T. Hutchings, C. G. Windsor and C. Andreani, Adv. Physics 34 (1985) 445.
H. Ruppersberg, Adv. X-Ray Analysis 35 (1992) 481.
H. Ruppersberg and I. Detemple, Mater. Sci. Engng. A161 (1993) 41.
G. Brusch and W. Reimers, ``Proceedings of the ICRS 5 Linköping, Sweden, 1997'' to be published.
O. T. Iancu and D. Munz, J. Amer. Ceram. Soc. 73 (1990) 1144.
A. E. Tekkaya, Ph.D. Thesis, Universität Stuttgart (1986).
A. Pyzalla and W. Reimers, in ``Competitive advantages by near-net-shape manufacturing'', edited by H.-D. Kunze (DGM–Informationsgesellschaft, Verlag, Oberursel 1997) p. 175.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Reimers, W., Pyzalla, A., Broda, M. et al. The Use of High-Energy Synchrotron Diffraction for Residual Stress Analyses. Journal of Materials Science Letters 18, 581–583 (1999). https://doi.org/10.1023/A:1006651217517
Issue Date:
DOI: https://doi.org/10.1023/A:1006651217517